@conference {105, title = {A Physical-Statistical Approach to AlGaN/GaN HEMT Reliability}, booktitle = {2019 IEEE International Reliability Physics Symposium (IRPS)2019 IEEE International Reliability Physics Symposium (IRPS)}, year = {2019}, publisher = {IEEE}, organization = {IEEE}, address = {Monterey, CA, USA}, doi = {10.1109/IRPS.2019.8720521}, author = {Moens, Peter and Stockman, Arno} }