GaN-based lateral and vertical devices: physical mechanisms limiting stability and reliability

TitleGaN-based lateral and vertical devices: physical mechanisms limiting stability and reliability
Publication TypeConference Paper
Year of Publication2019
AuthorsMeneghesso G, Meneghini M, De Santi C, Zanoni E
Conference Name2019 Electron Devices Technology and Manufacturing Conference (EDTM)2019 Electron Devices Technology and Manufacturing Conference (EDTM)
PublisherIEEE
Conference LocationSingapore, Singapore
DOI10.1109/EDTM.2019.8731064