Interplay between C-doping, threading dislocations, breakdown, and leakage in GaN on Si HEMT structures

TitleInterplay between C-doping, threading dislocations, breakdown, and leakage in GaN on Si HEMT structures
Publication TypeJournal Article
Year of Publication2020
AuthorsBesendörfer S., Meissner E., Zweipfennig T., Yacoub H., Fahle D., Behmenburg H., Kalisch H., Vescan A., Friedrich J., Erlbacher T.
JournalAIP Advances
Volume10
Issue4
Pagination045028
Date PublishedJan-04-2020
DOI10.1063/1.5141905
Short TitleAIP Advances