Scientific Papers

Export 1 results:
Filters: Keyword is GaN and Author is B. Bakeroot  [Clear All Filters]
2018
Stockman A., Canato E., Tajalli A., Meneghini M., Meneghesso G., Zanoni E., Moens P., Bakeroot B..  2018.  On the origin of the leakage current in p-gate AlGaN/GaN HEMTs. 2018 IEEE International Reliability Physics Symposium (IRPS).