GaN-on-Silicon buffer decomposition experiment: analysis of the vertical leakage current

TitleGaN-on-Silicon buffer decomposition experiment: analysis of the vertical leakage current
Publication TypeConference Paper
Year of Publication2019
AuthorsBorga M., Meneghini M., Benazzi D, Püsche R, Derluyn J, Abid I, Medjdoub F., Meneghesso G., Zanoni E.
Conference Name43rd Workshop on Compound Semiconductor Devices and Integrated Circuits, WOCSDICE 2019
Conference Locationcabourg, France
URLhttps://hal.archives-ouvertes.fr/hal-02356883