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Micro-seconds-Range Evaluation of Threshold Voltage Instabilities of GaN-on-Si HEMTs with p-GaN Gate
| Title | Micro-seconds-Range Evaluation of Threshold Voltage Instabilities of GaN-on-Si HEMTs with p-GaN Gate |
| Publication Type | Conference Paper |
| Year of Publication | 2019 |
| Authors | Canato E., Masin F., Borga M., Zanoni E., Meneghini M., Meneghesso G., Stockman A., Banerjee A., Moens P. |
| Conference Name | 2019 IEEE International Reliability Physics Symposium (IRPS)2019 IEEE International Reliability Physics Symposium (IRPS) |
| Publisher | IEEE |
| Conference Location | Monterey, CA, USA |
| URL | https://ieeexplore.ieee.org/document/8720549/http://xplorestaging.ieee.org/ielx7/8712125/8720395/08720549.pdf?arnumber=8720549 |
| DOI | 10.1109/IRPS.2019.8720549 |
